Gardien Group has accepted the invitation from IPC to present a research paper, entitled “Analysis on Combination of AOI and AVI Machines,” at IPC APEX Expo 2011 on April 12, 2011. The event takes place at the Mandalay Bay Convention Center in Las Vegas, Nevada.
This research paper is written by Alex Fung, the Technical Director of Gardien Group, who has over 20 years of experience in the electronics industry, covering areas in R&D, manufacturing, engineering, materials management and quality control.
This paper analyzes the combination of AOI and AVI to meet this objective. There are five segments in this paper. The first part focuses on the application of AOI and AVI and identifies all kinds of defects and boards which they can inspect. The second part compares and contrasts the hardware and software of AOI and AVI machines. The third part studies the finding of defects under the application and the machine issues related to AOI and AVI. The fourth part examines the possibilities in combining AOI and AVI. The fifth part summarizes the key elements that caused the pros and cons of the universal machine (or so-called combined machine).
Roland Valentini, COO of Gardien, said, “This is our honor to participate in such world-class conference in sharing our expertise experience with others in this field, and we will definite welcome any further discussion about the subject in future.”
About Gardien
The Gardien Group is the world’s largest provider of independent testing services to the PCB manufacturing industry. From small batch testing in one of the company’s 24 facilities located throughout Asia and North America, to fully integrated inspection within a PCB production environment, Gardien’s 600 employees serve customers supplying the automotive, defense, telecommunications, computer and industrial markets. For more information, contact Roland Valentini at +1-503-781-7308.